Resonant escape over an oscillating barrier in a single-electron ratchet transfer

Satoru Miyamoto, Katsuhiko Nishiguchi, Yukinori Ono, Kohei M. Itoh, and Akira Fujiwara
Phys. Rev. B 82, 033303 – Published 22 July 2010

Abstract

Single-electron escape from a metastable state over an oscillating barrier is experimentally investigated in silicon-based ratchet transfer. When the barrier is oscillating on a time-scale characteristic of the single-electron escape, synchronization occurs between the deterministic barrier modulation and the stochastic escape events. The average escape time as a function of its oscillation frequency exhibits a minimum providing a primary signature for resonant activation of single electrons.

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  • Received 18 September 2009

DOI:https://doi.org/10.1103/PhysRevB.82.033303

©2010 American Physical Society

Authors & Affiliations

Satoru Miyamoto1,2, Katsuhiko Nishiguchi1, Yukinori Ono1, Kohei M. Itoh2, and Akira Fujiwara1,*

  • 1NTT Basic Research Laboratories, NTT Corporation, 3-1 Morinosato Wakamiya, Atsugi, Kanagawa 243-0198, Japan
  • 2School of Fundamental Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama 223-8522, Japan

  • *afuji@will.brl.ntt.co.jp

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Vol. 82, Iss. 3 — 15 July 2010

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