Abstract
The temperature dependence of the lattice parameter of alloys deposited on Si substrates has been determined from an analysis of their x-ray reciprocal-space maps. It is found that over the range the alloy thermal expansivity increases by up to 20% as a function of . This implies a strong deviation from a linear interpolation between the end compounds since the thermal expansivities of pure Ge and are nearly the same. Alternative interpolation formulas based on a Debye model and a mixed Debye-Einstein model of the phonon structure are tested and it is found that they also fail to explain the observed increase in thermal expansivity.
- Received 19 February 2010
DOI:https://doi.org/10.1103/PhysRevB.81.245214
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