Statistics of voltage fluctuations in resistively shunted Josephson junctions

D. S. Golubev, M. Marthaler, Y. Utsumi, and Gerd Schön
Phys. Rev. B 81, 184516 – Published 17 May 2010

Abstract

The intrinsic nonlinearity of Josephson junctions converts Gaussian current noise in the input into non-Gaussian voltage noise in the output. For a resistively shunted Josephson junction with white input noise we determine numerically exactly the properties of the few lowest cumulants of the voltage fluctuations, and we derive analytical expressions for these cumulants in several important limits. The statistics of the voltage fluctuations is found to be Gaussian at bias currents well above the Josephson critical current but Poissonian at currents below the critical value. In the transition region close to the critical current the higher-order cumulants oscillate and the voltage noise is strongly non-Gaussian. For colored input noise we determine the third cumulant of the voltage.

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  • Received 23 February 2010

DOI:https://doi.org/10.1103/PhysRevB.81.184516

©2010 American Physical Society

Authors & Affiliations

D. S. Golubev1, M. Marthaler2, Y. Utsumi3, and Gerd Schön1,2

  • 1Institut für Nanotechnologie, Karlsruhe Institute of Technology, 76021 Karlsruhe, Germany
  • 2Institut für Theoretische Festkörperphysik and DFG Center for Functional Nanostructures (CFN), Karlsruhe Institute of Technology, 76128 Karlsruhe, Germany
  • 3Institute for Solid State Physics, University of Tokyo, Kashiwa, Chiba 277-8581, Japan

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Issue

Vol. 81, Iss. 18 — 1 May 2010

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