Abstract
We have studied the growth and electronic/transport properties of ultrathin alloy films, which the bulk is reported to be a topological insulator for . We found that single crystal epitaxial films as thin as could be grown on silicon for . The topological number of the films was shown to be nontrivial from the surface Fermi surface. Moreover a crossover from an insulating to a metallic behavior was observed upon reducing the film thickness, revealing the clear detection of the topological-metal conductivity. Our results settle the controversial issues concerning the metallicity of at low temperature and verify that the surface/volume ratio must be extensively enhanced to properly understand the nature of these surface states.
- Received 28 January 2010
DOI:https://doi.org/10.1103/PhysRevB.81.165422
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