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Electron paramagnetic resonance of boron acceptors in isotopically purified silicon

H. Tezuka, A. R. Stegner, A. M. Tyryshkin, S. Shankar, M. L. W. Thewalt, S. A. Lyon, K. M. Itoh, and M. S. Brandt
Phys. Rev. B 81, 161203(R) – Published 19 April 2010

Abstract

The electron paramagnetic resonance (EPR) linewidths of B acceptors in Si are found to reduce dramatically in isotopically purified S28i single crystals. Moreover, extremely narrow substructures in the EPR spectra are visible corresponding to either an enhancement or a reduction in the absorbed microwave on resonance. The origin of the substructures is attributed to a combination of simultaneous double excitation and spin relaxation in the four level spin system of the acceptors. A spin population model is developed which qualitatively describes the experimental results.

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  • Received 22 March 2010

DOI:https://doi.org/10.1103/PhysRevB.81.161203

©2010 American Physical Society

Authors & Affiliations

H. Tezuka1, A. R. Stegner2, A. M. Tyryshkin3, S. Shankar3, M. L. W. Thewalt4, S. A. Lyon3, K. M. Itoh1,*, and M. S. Brandt2

  • 1School of Fundamental Science and Technology, Keio University, Yokohama 223-8522, Japan
  • 2Walter Schottky Institut, Technische Universität München, Am Coulombwall 3, 85748 Garching, Germany
  • 3Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, USA
  • 4Department of Physics, Simon Fraser University, Burnaby, British Columbia, Canada V5A 1S6

  • *kitoh@appi.keio.ac.jp

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Vol. 81, Iss. 16 — 15 April 2010

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