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Phase-contrast tomography at the nanoscale using hard x rays

Marco Stampanoni, Rajmund Mokso, Federica Marone, Joan Vila-Comamala, Sergey Gorelick, Pavel Trtik, Konstantin Jefimovs, and Christian David
Phys. Rev. B 81, 140105(R) – Published 20 April 2010

Abstract

Synchrotron-based full-field tomographic microscopy established itself as a tool for noninvasive investigations. Many beamlines worldwide routinely achieve micrometer spatial resolution while the isotropic 100-nm barrier is reached and trespassed only by few instruments, mainly in the soft x-ray regime. We present an x-ray, full-field microscope with tomographic capabilities operating at 10 keV and with an isotropic resolution of 144 nm. Custom-designed optical components allow for ideal, aperture-matched sample illumination and very sensitive phase contrast imaging. We show here that the instrument has been successfully used for the nondestructive, volumetric investigation of single cells.

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  • Received 25 February 2010

DOI:https://doi.org/10.1103/PhysRevB.81.140105

©2010 American Physical Society

Authors & Affiliations

Marco Stampanoni1,2, Rajmund Mokso1, Federica Marone1, Joan Vila-Comamala1, Sergey Gorelick1, Pavel Trtik3, Konstantin Jefimovs3, and Christian David1

  • 1Paul Scherrer Institut, 5232 Villigen, Switzerland
  • 2Institute for Biomedical Engineering, University of Zürich and ETH Zürich, 8092 Zürich, Switzerland
  • 3Materials Science and Technology, EMPA, 8600 Dübendorf, Switzerland

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Issue

Vol. 81, Iss. 14 — 1 April 2010

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