Measuring charge trap occupation and energy level in CdSe/ZnS quantum dots using a scanning tunneling microscope

M. R. Hummon, A. J. Stollenwerk, V. Narayanamurti, P. O. Anikeeva, M. J. Panzer, V. Wood, and V. Bulović
Phys. Rev. B 81, 115439 – Published 22 March 2010

Abstract

We use a scanning tunneling microscope to probe single-electron charging phenomena in individual CdSe/ZnS (core/shell) quantum dots (QDs) at room temperature. The QDs are deposited on top of a bare Au thin film and form a double-barrier tunnel junction (DBTJ) between the tip, QD, and substrate. Analysis of room-temperature hysteresis in the current-voltage (IV) tunneling spectra, is consistent with trapped charge(s) presenting an additional potential barrier to tunneling, a measure of the Coulomb blockade. The paper describes the first direct electrical measurement of the trap-state energy on individual QDs. Manipulation of the charge occupation of the QD, verified by measuring the charging energy, (61.4±2.4)meV, and analysis of the DBTJ, show trap states 1.09eV below the QD conduction-band edge. In addition, the detrapping time, a measure of the tunneling barrier thickness, is determined to have an upper time limit of 250 ms. We hypothesize that the charge is trapped in a quantum-dot surface state.

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  • Received 22 July 2009

DOI:https://doi.org/10.1103/PhysRevB.81.115439

©2010 American Physical Society

Authors & Affiliations

M. R. Hummon*, A. J. Stollenwerk, and V. Narayanamurti

  • School of Engineering and Applied Sciences, Harvard University, Cambridge, Massachusetts 02138, USA

P. O. Anikeeva, M. J. Panzer, V. Wood, and V. Bulović

  • Laboratory of Organic Optics and Electronics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA

  • *marissa.hummon@post.harvard.edu

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Vol. 81, Iss. 11 — 15 March 2010

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