Exchange bias in a ferromagnetic semiconductor induced by a ferromagnetic metal: Fe/(Ga,Mn)As bilayer films studied by XMCD measurements and SQUID magnetometry

K. Olejnik, P. Wadley, J. A. Haigh, K. W. Edmonds, R. P. Campion, A. W. Rushforth, B. L. Gallagher, C. T. Foxon, T. Jungwirth, J. Wunderlich, S. S. Dhesi, S. A. Cavill, G. van der Laan, and E. Arenholz
Phys. Rev. B 81, 104402 – Published 3 March 2010

Abstract

We demonstrate an exchange bias in (Ga,Mn)As induced by antiferromagnetic coupling to a thin overlayer of Fe. Bias fields of up to 240 Oe are observed. Using element-specific x-ray magnetic circular dichroism measurements, we distinguish a strongly exchange-coupled (Ga,Mn)As interface layer in addition to the biased bulk of the (Ga,Mn)As film. The interface layer remains polarized at room temperature.

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  • Received 12 November 2009

DOI:https://doi.org/10.1103/PhysRevB.81.104402

©2010 American Physical Society

Authors & Affiliations

K. Olejnik1,2, P. Wadley3, J. A. Haigh3, K. W. Edmonds3, R. P. Campion3, A. W. Rushforth3, B. L. Gallagher3, C. T. Foxon3, T. Jungwirth2,3, J. Wunderlich1,2, S. S. Dhesi4, S. A. Cavill4, G. van der Laan4, and E. Arenholz5

  • 1Hitachi Cambridge Laboratory, Cambridge CB3 0HE, United Kingdom
  • 2Institute of Physics, ASCR, v.v.i., Cukrovarnicka 10, 16253 Praha 6, Czech Republic
  • 3School of Physics and Astronomy, University of Nottingham, Nottingham NG7 2RD, United Kingdom
  • 4Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, United Kingdom
  • 5Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

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Issue

Vol. 81, Iss. 10 — 1 March 2010

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