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Ultrasensitive detection of lateral atomic-scale interactions on graphite (0001) via bimodal dynamic force measurements

Shigeki Kawai, Thilo Glatzel, Sascha Koch, Bartosz Such, Alexis Baratoff, and Ernst Meyer
Phys. Rev. B 81, 085420 – Published 17 February 2010

Abstract

Enhanced sensitivity to lateral forces on the nominally flat and inert (0001) surface of graphite is demonstrated via room-temperature dynamic force microscopy using simultaneous excitation and FM detection of the lowest flexural and torsional cantilever resonance modes. The site-independent long-range tip-sample interaction causes no significant lateral force variations except near atomic steps but unprecedented sensitivity to short-range forces is achieved on flat terraces in the attractive range. Two-dimensional bimodal force vs distance maps confirm the stronger distance dependence of the torsional frequency shift compared to the flexural resonance shift. This agrees with model calculations based on theoretical expressions. The lateral force gradient is extracted from the measured torsional shift, and a lateral force variation in at most ±20pN is obtained by integrating this gradient parallel to the surface. A further integration reveals a potential-energy variation in the attractive force range of only 3 meV.

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  • Received 11 December 2009

DOI:https://doi.org/10.1103/PhysRevB.81.085420

©2010 American Physical Society

Authors & Affiliations

Shigeki Kawai*, Thilo Glatzel, Sascha Koch, Bartosz Such, Alexis Baratoff, and Ernst Meyer

  • Department of Physics, University of Basel, Klingelbergstr. 82, 4056 Basel, Switzerland

  • *shigeki.kawai@unibas.ch
  • Present address: Research Centre for Nanometer-Scale Science and Advanced Materials (NANOSAM), Faculty of Physics, Astronomy, and Applied Computer Science, Jagiellonian University, Reymonta 4, 30-059 Krakow, Poland.

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Vol. 81, Iss. 8 — 15 February 2010

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