Multiscale investigation of the structure and morphology of the Co/Fe2O3(0001) interface

O. Bezencenet, H. Magnan, C. Mocuta, E. Fonda, S. Stanescu, P. Ohresser, R. Belkhou, and A. Barbier
Phys. Rev. B 81, 085419 – Published 17 February 2010

Abstract

We report a detailed structural characterization of Co films grown on α-Fe2O3(0001) for thicknesses up to 25 nm. Epitaxial and single-crystalline 20 nm thick α-Fe2O3(0001) layers deposited on α-Al2O3(0001) and Pt(111) single crystals were used as substrate. The Co/α-Fe2O3(0001) interface is a prototypical magnetic exchange coupled system for which the magnetocrystalline parameters are crucial to address. We evidence medium range order requiring a multiscale approach to reach a reliable description of the crystalline structure. Surface extended x-ray absorption fine structure (EXAFS) and surface x-ray diffraction (SXRD) have been combined to describe the structure in an extended thickness range. Additional grazing incidence small angle x-ray scattering (GISAXS) measurements show that the growth is three dimensional up to 3nm and follows a nucleation—growth—coalescence scheme. For all thicknesses cobalt is found to grow with a lattice parameter close to its bulk lattice parameter. In the early stages of growth a disordered 2–3 monolayer thick interface exhibiting oxidized cobalt and metallic iron is evidenced. Long range order sets in for thickness above 4 nm showing the coexistence of fcc, twinned fcc, and hcp stacking within direct and in-surface-plane 30° rotated epitaxial relationships.

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  • Received 22 December 2009

DOI:https://doi.org/10.1103/PhysRevB.81.085419

©2010 American Physical Society

Authors & Affiliations

O. Bezencenet1,*, H. Magnan1, C. Mocuta2, E. Fonda2, S. Stanescu2, P. Ohresser2, R. Belkhou2, and A. Barbier1,†

  • 1CEA, IRAMIS, SPCSI, F-91191 Gif-sur-Yvette Cedex, France
  • 2Synchrotron SOLEIL, L’Orme des Merisiers, Saint-Aubin, F-91192 Gif-sur-Yvette Cedex, France

  • *Present address: THALES Research and Technology France, 1 Avenue Augustin Fresnel, Campus de Polytechnique, F-91767 Palaiseau Cedex, France.
  • abarbier@cea.fr; http://iramis.cea.fr/en/

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Issue

Vol. 81, Iss. 8 — 15 February 2010

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