Abstract
We report a detailed structural characterization of Co films grown on for thicknesses up to 25 nm. Epitaxial and single-crystalline 20 nm thick layers deposited on and Pt(111) single crystals were used as substrate. The interface is a prototypical magnetic exchange coupled system for which the magnetocrystalline parameters are crucial to address. We evidence medium range order requiring a multiscale approach to reach a reliable description of the crystalline structure. Surface extended x-ray absorption fine structure (EXAFS) and surface x-ray diffraction (SXRD) have been combined to describe the structure in an extended thickness range. Additional grazing incidence small angle x-ray scattering (GISAXS) measurements show that the growth is three dimensional up to and follows a nucleation—growth—coalescence scheme. For all thicknesses cobalt is found to grow with a lattice parameter close to its bulk lattice parameter. In the early stages of growth a disordered 2–3 monolayer thick interface exhibiting oxidized cobalt and metallic iron is evidenced. Long range order sets in for thickness above 4 nm showing the coexistence of fcc, twinned fcc, and hcp stacking within direct and in-surface-plane rotated epitaxial relationships.
1 More- Received 22 December 2009
DOI:https://doi.org/10.1103/PhysRevB.81.085419
©2010 American Physical Society