Raman spectroscopy of wurtzite and zinc-blende GaAs nanowires: Polarization dependence, selection rules, and strain effects

I. Zardo, S. Conesa-Boj, F. Peiro, J. R. Morante, J. Arbiol, E. Uccelli, G. Abstreiter, and A. Fontcuberta i Morral
Phys. Rev. B 80, 245324 – Published 31 December 2009

Abstract

Polarization-dependent Raman scattering experiments realized on single GaAs nanowires with different percentages of zinc-blende and wurtzite structure are presented. The selection rules for the special case of nanowires are found and discussed. In the case of zinc-blende, the transversal optical mode E1 (TO) at 267cm1 exhibits the highest intensity when the incident and analyzed polarization are parallel to the nanowire axis. This is a consequence of the nanowire geometry and dielectric mismatch with the environment, and in quite good agreement with the Raman selection rules. We also find a consistent splitting of 1cm1 of the E1 (TO). The transversal optical mode related to the wurtzite structure, E2H, is measured between 254 and 256cm1, depending on the wurtzite content. The azimuthal dependence of E2H indicates that the mode is excited with the highest efficiency when the incident and analyzed polarization are perpendicular to the nanowire axis, in agreement with the selection rules. The presence of strain between wurtzite and zinc-blende is analyzed by the relative shift of the E1 (TO) and E2H modes. Finally, the influence of the surface roughness in the intensity of the longitudinal optical mode on {110} facets is presented.

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  • Received 10 August 2009

DOI:https://doi.org/10.1103/PhysRevB.80.245324

©2009 American Physical Society

Authors & Affiliations

I. Zardo1, S. Conesa-Boj2, F. Peiro2, J. R. Morante2,3, J. Arbiol2,4, E. Uccelli1,5, G. Abstreiter1, and A. Fontcuberta i Morral1,5

  • 1Walter Schottky Institut and Physik Department, Technische Universität München, Am Coulombwall 3, 85748 Garching, Germany
  • 2Departament d’Electronica, Universitat de Barcelona, 08028 Barcelona, CAT, Spain
  • 3IREC, Catalonia Institute for Energy Research, Barcelona 08019, Spain
  • 4Institut de Ciència de Materials de Barcelona, CSIC, 08193 Bellaterra, CAT, Spain
  • 5Laboratoire des Matériaux Semiconducteurs, Institut des Matériaux, Ecole Polytechnique Fédérale de Lausanne, CH-1015 Lausanne, Switzerland

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Vol. 80, Iss. 24 — 15 December 2009

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