Optical properties and optimization of electromagnetically induced transparency in strained InAs/GaAs quantum dot structures

D. Barettin, J. Houmark, B. Lassen, M. Willatzen, T. R. Nielsen, J. Mørk, and A.-P. Jauho
Phys. Rev. B 80, 235304 – Published 2 December 2009

Abstract

Using multiband kp theory we study the size and geometry dependence on the slow light properties of conical semiconductor quantum dots. We find the V-type scheme for electromagnetically induced transparency (EIT) to be most favorable and identify an optimal height and size for efficient EIT operation. In case of the ladder scheme, the existence of additional dipole allowed intraband transitions along with an almost equidistant energy-level spacing adds additional decay pathways, which significantly impairs the EIT effect. We further study the influence of strain and band mixing comparing four different kp band-structure models. In addition to the separation of the heavy and light holes due to the biaxial-strain component, we observe a general reduction in the transition strengths due to energy crossings in the valence bands caused by strain and band-mixing effects. We furthermore find a nontrivial quantum dot size dependence of the dipole moments directly related to the biaxial-strain component. Due to the separation of the heavy and light holes the optical transition strengths between the lower conduction and upper most valence-band states computed using one-band model and eight-band model show general qualitative agreement, with exceptions relevant for EIT operation.

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  • Received 21 September 2009

DOI:https://doi.org/10.1103/PhysRevB.80.235304

©2009 American Physical Society

Authors & Affiliations

D. Barettin*

  • Mads Clausen Institute for Product Innovation, University of Southern Denmark, 6400 Sønderborg, Denmark

J. Houmark

  • DTU Nanotech, Department of Micro- and Nanotechnology, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark

B. Lassen and M. Willatzen

  • Mads Clausen Institute for Product Innovation, University of Southern Denmark, 6400 Sønderborg, Denmark

T. R. Nielsen and J. Mørk

  • DTU Fotonik, Department of Photonics Engineering, Technical University of Denmark, Building 343, DK-2800 Kongens Lyngby, Denmark

A.-P. Jauho

  • DTU Nanotech, Department of Micro- and Nanotechnology, Technical University of Denmark, DK-2800 Kongens Lyngby, Denmark and Department of Applied Physics, Helsinki University of Technology, P.O. Box 1100, Helsinki FI-02015 HUT, Finland

  • *Corresponding author; daniele@mci.sdu.dk

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Issue

Vol. 80, Iss. 23 — 15 December 2009

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