Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy images

James M. LeBeau, Adrian J. D’Alfonso, Scott D. Findlay, Susanne Stemmer, and Leslie J. Allen
Phys. Rev. B 80, 174106 – Published 10 November 2009

Abstract

Quantitative, atomic resolution bright-field scanning transmission electron microscopy experiments are reported. The image intensities are placed on an absolute scale relative to the incident beam intensity. Features in the experimental images, such as contrast reversals, intensities, and the image contrast, are compared with image simulations that account for elastic scattering and the effect of phonon scattering. Simulations are carried out using both the multislice absorptive and frozen phonon simulation methods. For a SrTiO3 sample with thicknesses between 4 and 25 nm, both models agree within the experimental uncertainty. We demonstrate excellent agreement between the simulated and the experimentally observed image contrast. The implications for the contrast mismatch commonly reported for high-resolution transmission electron microscopy using plane-wave illumination are discussed.

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  • Received 15 September 2009

DOI:https://doi.org/10.1103/PhysRevB.80.174106

©2009 American Physical Society

Authors & Affiliations

James M. LeBeau1, Adrian J. D’Alfonso2, Scott D. Findlay3, Susanne Stemmer1, and Leslie J. Allen2

  • 1Materials Department, University of California, Santa Barbara, California 93106-5050, USA
  • 2School of Physics, University of Melbourne, Victoria 3010, Australia
  • 3Institute of Engineering Innovation, School of Engineering, The University of Tokyo, Tokyo 113-8656, Japan

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Vol. 80, Iss. 17 — 1 November 2009

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