Effects of focused ion beam induced damage on the plasticity of micropillars

Jaafar A. El-Awady, Christopher Woodward, Dennis M. Dimiduk, and Nasr M. Ghoniem
Phys. Rev. B 80, 104104 – Published 9 September 2009

Abstract

The hardening effects of focused ion beam (FIB) induced damage produced during the fabrication of micropillars are examined by introducing a surface layer of nanosized obstacles into a dislocation dynamics simulation. The influence of the depth and strength of the obstacles as a function of pillar diameter is assessed parametrically. We show that for a selected set of sample sizes between 0.5 and 1.0μm, the flow strength can increase by 1020%, for an obstacle strength of 750 MPa, and damage depth of 100 nm. On the other hand, for sizes larger and smaller than this range, the effect of damage is negligible. Results show that the obstacles formed during the FIB milling may be expected to alter the microstructure of micropillars, however, they have a negligible effect on the observed size-strength scaling laws.

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  • Received 2 July 2009

DOI:https://doi.org/10.1103/PhysRevB.80.104104

©2009 American Physical Society

Authors & Affiliations

Jaafar A. El-Awady1,*, Christopher Woodward1, Dennis M. Dimiduk1, and Nasr M. Ghoniem2

  • 1Air Force Research Laboratory, Materials and Manufacturing Directorate, AFRL/RXLM Wright-Patterson AFB, Ohio 45433-7817, USA
  • 2Mechanical and Aerospace Department, University of California, Los Angeles, California 90095-1597, USA

  • *Also at Universal Technology Corporation, Dayton, OH 45432, USA; jaafar.el-awady@wpafb.af.mil

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Vol. 80, Iss. 10 — 1 September 2009

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