Abstract
We used low-energy electron microscopy (LEEM) and scanning tunneling microscopy (STM) to investigate domain structures of epitaxial few-layer graphene grown on SiC(0001). Dark-field (DF) LEEM images formed using (10) and (01) beams clearly indicate that bilayer graphene consists of two types of domains, which have threefold symmetry and are rotated by with respect to each other. The DF LEEM images show clear domain contrasts at energies where (10)- and (01)-beam intensities calculated for bulk graphite are largely different. This means that the two types of domains are different in stacking: and stackings. The stacking domains are also supported by the STM images of bilayer graphene showing both hexagonal and honeycomb patterns.
- Received 10 April 2009
DOI:https://doi.org/10.1103/PhysRevB.80.085406
©2009 American Physical Society
Synopsis
Sizing up domain walls in bilayer graphene
Published 10 August 2009
The mobility of charge carriers in epitaxial bilayer graphene may be limited by structural domains.
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