Implicit spatial averaging in inversion of inelastic x-ray scattering data

P. Abbamonte, J. P. Reed, Y. I. Joe, Yu Gan, and D. Casa
Phys. Rev. B 80, 054302 – Published 4 August 2009

Abstract

Inelastic x-ray scattering (IXS) is now a widely used technique for studying the dynamics of electrons in condensed matter. We previously posed a solution to the phase problem for IXS [P. Abbamonte et al., Phys. Rev. Lett. 92, 237401 (2004)] that allows explicit reconstruction of the density propagator of a system. The propagator represents, physically, the response of the system to an idealized, point perturbation, so provides direct, real-time images of electron motion with attosecond time resolution and Å-scale spatial resolution. Here we show that the images generated by our procedure, as it was originally posed, are spatial averages over all source locations. Within an idealized, atomiclike model, we show that in most cases a simple relationship to the complete, unaveraged response can still be determined. We illustrate this concept for recent IXS measurements of single-crystal graphite.

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  • Received 13 April 2009

DOI:https://doi.org/10.1103/PhysRevB.80.054302

©2009 American Physical Society

Authors & Affiliations

P. Abbamonte1, J. P. Reed1, Y. I. Joe1, Yu Gan1, and D. Casa2

  • 1Frederick Seitz Materials Research Laboratory and Department of Physics, University of Illinois, Urbana, Illinois 61801, USA
  • 2Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA

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Vol. 80, Iss. 5 — 1 August 2009

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