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Bias-controlled sensitivity of ferromagnet/semiconductor electrical spin detectors

S. A. Crooker, E. S. Garlid, A. N. Chantis, D. L. Smith, K. S. M. Reddy, Q. O. Hu, T. Kondo, C. J. Palmstrøm, and P. A. Crowell
Phys. Rev. B 80, 041305(R) – Published 10 July 2009

Abstract

Using Fe/GaAs Schottky tunnel barriers as electrical spin detectors, we show that the magnitude and the sign of their spin-detection sensitivities can be widely tuned with the voltage bias applied across the Fe/GaAs interface. Experiments and theory establish that this tunability derives not just simply from the bias dependence of the tunneling conductances G, (a property of the interface), but also from the bias dependence of electric fields in the semiconductor which can dramatically enhance or suppress spin-detection sensitivities. Electrons in GaAs with fixed polarization can therefore be made to induce either positive or negative voltage changes at spin detectors, and some detector sensitivities can be enhanced over tenfold compared to the usual case of zero-bias spin detection.

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  • Received 9 June 2009

DOI:https://doi.org/10.1103/PhysRevB.80.041305

©2009 American Physical Society

Authors & Affiliations

S. A. Crooker1,*, E. S. Garlid2, A. N. Chantis1, D. L. Smith1, K. S. M. Reddy3, Q. O. Hu2, T. Kondo2,†, C. J. Palmstrøm3,4, and P. A. Crowell2

  • 1Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA
  • 2School of Physics and Astronomy, University of Minnesota, Minneapolis, Minnesota 55455, USA
  • 3Department of Chemical Engineering & Materials Science, University of Minnesota, Minneapolis, Minnesota 55455, USA
  • 4Departments of Electrical & Computer Engineering and Materials, University of California, Santa Barbara, California 93106, USA

  • *crooker@lanl.gov
  • On leave from the Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, Yokohama 226, Japan.

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Vol. 80, Iss. 4 — 15 July 2009

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