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Spatially resolved spectroscopy of monolayer graphene on SiO2

A. Deshpande, W. Bao, F. Miao, C. N. Lau, and B. J. LeRoy
Phys. Rev. B 79, 205411 – Published 15 May 2009
Physics logo See Synopsis: The ripple effect?

Abstract

We carried out scanning tunneling spectroscopy measurements on exfoliated monolayer graphene on SiO2 to probe the correlation between its electronic and structural properties. Maps of the local density of states are characterized by electron and hole puddles that arise due to long-range intravalley scattering from intrinsic ripples in graphene and random-charged impurities. At low energy, we observe short-range intervalley scattering which we attribute to lattice defects. Our results demonstrate that the electronic properties of graphene are influenced by intrinsic ripples, defects, and the underlying SiO2 substrate.

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  • Received 5 December 2008

DOI:https://doi.org/10.1103/PhysRevB.79.205411

©2009 American Physical Society

Synopsis

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The ripple effect?

Published 26 May 2009

Scanning tunneling spectroscopy establishes the dominant mechanism of electron scattering when graphene is placed on a substrate.

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Authors & Affiliations

A. Deshpande1, W. Bao2, F. Miao2, C. N. Lau2, and B. J. LeRoy1,*

  • 1Department of Physics, University of Arizona, Tucson, Arizona 85721, USA
  • 2Department of Physics, University of California at Riverside, Riverside, California 92521, USA

  • *leroy@physics.arizona.edu

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Issue

Vol. 79, Iss. 20 — 15 May 2009

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