Abstract
The shape of the outer valence photoelectron spectrum of Ar clusters is investigated by vacuum ultraviolet photoionization with synchrotron radiation. We show the dependence of the spectrum on cluster size and the change in its shape with photon energy. Inelastic losses due to intracluster photoelectron scattering are most important for changes in the photoelectron main line and explain the appearance of additional peaks. A comparison of our results to earlier work on bulk condensed Ar and Ar thin films is given. Evidence for a deviation of the photoionization cross sections for clusters from the atomic ones has not been found.
- Received 21 November 2008
DOI:https://doi.org/10.1103/PhysRevB.79.155448
©2009 American Physical Society