Single-crystal lattice dynamics derived from polycrystalline inelastic x-ray scattering spectra

I. Fischer, A. Bosak, and M. Krisch
Phys. Rev. B 79, 134302 – Published 10 April 2009

Abstract

We present a methodology to extract the single-crystal phonon dispersion from polycrystalline materials. The approach consists of recording inelastic x-ray scattering (IXS) spectra over a large momentum transfer region (typically 280nm1), and confront them with a model calculation which properly takes into account the polycrystalline state of the material and the IXS cross section. A least-squares refinement of the model spectra then provides the single-crystal dispersion scheme. For the benchmark cases beryllium and graphite we demonstrate that very good agreement with available single-crystal phonon dispersions is obtained. Furthermore, we show for the case of graphite that a simple texture can be properly taken into account. The proposed method promises to be a valuable tool in cases where single-crystalline materials are not available.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
1 More
  • Received 23 September 2008

DOI:https://doi.org/10.1103/PhysRevB.79.134302

©2009 American Physical Society

Authors & Affiliations

I. Fischer, A. Bosak, and M. Krisch

  • European Synchrotron Radiation Facility, B.P. 220, F-38043 Grenoble Cedex, France

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 79, Iss. 13 — 1 April 2009

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×