Abstract
Potential steps naturally develop in graphene near metallic contacts. We investigate the influence of these steps on the transport in graphene field effect transistors. We give simple expressions to estimate the voltage-dependent contribution of the contacts to the total resistance and noise in the diffusive and ballistic regimes.
- Received 20 December 2008
DOI:https://doi.org/10.1103/PhysRevB.79.075428
©2009 American Physical Society