Figure 2
(Color online) Evolution of worst-case measurement fidelity,
, during 2DEG scattering dynamics as a function of the number of scattering events,
, for a range of values of the ratio of direct and exchange-scattering amplitudes and of 2DEG equilibrium polarization. The independent (base plane) axes on the plots parametrize the complex scattering amplitude ratio
: one axis is the magnitude,
(shown for
; the plots are restricted to this range because the worst-case fidelity is negligibly small outside it), and the other is the phase,
(shown for
). The number of scattering events,
, varies across the columns with values
,
, and
shown here. The 2DEG equilibrium polarization,
, varies across the rows with values
, 0.1, and 1 shown here. For
, we see that there are fairly large regions in the
parameter space for which the worst-case measurement fidelity is nonzero; however, (i)
still decays rapidly with number of scattering events and is rarely
(the fidelities desirable for high-quality measurement), and (ii)
is highly sensitive to the precise value of
and
in these regions.
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