Measuring phonon dephasing with ultrafast pulses using Raman spectral interference

F. C. Waldermann, Benjamin J. Sussman, J. Nunn, V. O. Lorenz, K. C. Lee, K. Surmacz, K. H. Lee, D. Jaksch, I. A. Walmsley, P. Spizziri, P. Olivero, and S. Prawer
Phys. Rev. B 78, 155201 – Published 9 October 2008

Abstract

A technique to measure the decoherence time of optical phonons in a solid is presented. Phonons are excited with a pair of time-delayed 80 fs near infrared pulses via spontaneous transient Raman scattering. The spectral fringe visibility of the resulting Raman pulse pair, as a function of time delay, is used to measure the phonon dephasing time. The method avoids the need to use either narrow band or few femtosecond pulses and is useful for low phonon excitations. The dephasing time of phonons created in bulk diamond is measured to be τ=6.8ps (Δν=1.56cm1).

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  • Received 12 April 2008

DOI:https://doi.org/10.1103/PhysRevB.78.155201

©2008 American Physical Society

Authors & Affiliations

F. C. Waldermann, Benjamin J. Sussman*, J. Nunn, V. O. Lorenz, K. C. Lee, K. Surmacz, K. H. Lee, D. Jaksch, and I. A. Walmsley

  • Clarendon Laboratory, University of Oxford, Parks Road, Oxford OX1 3PU, United Kingdom

P. Spizziri, P. Olivero, and S. Prawer

  • Center for Quantum Computer Technology, School of Physics, The University of Melbourne, Parkville, Victoria 3010, Australia

  • *Also at National Research Council of Canada, Ottawa, Ontario, Canada K1A 0R6; ben.sussman@nrc.ca

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Issue

Vol. 78, Iss. 15 — 15 October 2008

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