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Fast molecular-dynamics simulation for ferroelectric thin-film capacitors using a first-principles effective Hamiltonian

Takeshi Nishimatsu, Umesh V. Waghmare, Yoshiyuki Kawazoe, and David Vanderbilt
Phys. Rev. B 78, 104104 – Published 4 September 2008
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Abstract

A newly developed fast molecular dynamics method is applied to BaTiO3 ferroelectric thin-film capacitors with short-circuited electrodes or under applied voltage. The molecular dynamics simulations based on a first-principles effective Hamiltonian clarify that dead layers (or passive layers) between ferroelectrics and electrodes markedly affect the properties of capacitors, and predict that the system is unable to hop between a uniformly polarized ferroelectric structure and a striped ferroelectric domain structure at low temperatures. Simulations of hysteresis loops of thin-film capacitors are also performed, and their dependence on film thickness, epitaxial constraints, and electrodes are discussed.

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  • Received 14 April 2008

DOI:https://doi.org/10.1103/PhysRevB.78.104104

©2008 American Physical Society

Authors & Affiliations

Takeshi Nishimatsu1,2, Umesh V. Waghmare3, Yoshiyuki Kawazoe2, and David Vanderbilt1

  • 1Department of Physics and Astronomy, Rutgers University, 136 Frelinghuysen Road, Piscataway, New Jersey 08544-8019, USA
  • 2Institute for Materials Research (IMR), Tohoku University, Sendai 980-8577, Japan
  • 3Theoretical Sciences Unit, Jawaharlal Nehru Centre for Advanced Scientific Research (JNCASR), Jakkur, Bangalore, 560 064, India

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Issue

Vol. 78, Iss. 10 — 1 September 2008

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