Electronic structure, bonding character, and thermoelectric properties of semiconducting rhenium silicide with doping

Anning Qiu, Lanting Zhang, Aidang Shan, and Jiansheng Wu
Phys. Rev. B 77, 205207 – Published 22 May 2008

Abstract

The electronic structure and thermoelectric properties of ReSi1.75 and its doped systems are studied by the first-principles calculation using the full-potential linearized augmented plane-wave method in the local density approximation with self-interaction correction and the semiclassical Boltzmann theory. ReSi1.75 shows narrow gap semiconductor behavior with an indirect gap of 0.12 eV and a direct gap of 0.36 eV. The Fermi levels of Al- and Mo-doped systems move into the valence band. The Al-doped compound remains a semiconductor while the gap of Mo-doped compounds becomes small and nearly disappears. The relations between the electronic structure and thermoelectric properties of doped ReSi1.75 are analyzed and explained in detail. Our calculations strongly suggest that an excellent thermoelectric performance can be obtained for p-doped ReSi1.75 along [100] and for n-doped ReSi1.75 along [001] compared with the undoped compound.

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  • Received 20 January 2008

DOI:https://doi.org/10.1103/PhysRevB.77.205207

©2008 American Physical Society

Authors & Affiliations

Anning Qiu, Lanting Zhang*, Aidang Shan, and Jiansheng Wu

  • School of Materials Science and Engineering, Shanghai Jiao Tong University, 800 Dong Chuan Road, Shanghai 200240, People’s Republic of China

  • *Author to whom correspondence should be addressed; lantingzh@sjtu.edu.cn

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Issue

Vol. 77, Iss. 20 — 15 May 2008

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