Resonant inelastic x-ray scattering studies of the organic semiconductor copper phthalocyanine

C. N. Kodituwakku, C. A. Burns, A. H. Said, H. Sinn, X. Wang, T. Gog, D. M. Casa, and M. Tuel
Phys. Rev. B 77, 125205 – Published 10 March 2008

Abstract

We report resonant inelastic x-ray scattering (RIXS) measurements on polycrystalline and single crystal samples of the organic semiconductor β-copper phthalocyanine (CuPc) as well as time dependent density functional theory calculations of the electronic properties of the CuPc molecule. Resonant and nonresonant excitations were measured along the three crystal axes with 120meV resolution. We observe molecular excitations as well as charge-transfer excitons along certain crystal directions and compare our data with the calculations. Our results demonstrate that RIXS is a powerful tool for studying excitons and other electronic excitations in organic semiconductors.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Received 13 November 2007

DOI:https://doi.org/10.1103/PhysRevB.77.125205

©2008 American Physical Society

Authors & Affiliations

C. N. Kodituwakku1,2, C. A. Burns1, A. H. Said2, H. Sinn2,3, X. Wang1, T. Gog2, D. M. Casa2, and M. Tuel1

  • 1Department of Physics, Western Michigan University, Kalamazoo, Michigan 49008-5252, USA
  • 2XSD, Advanced Photon Source, Argonne, Illinois 60439, USA
  • 3DESY, Hasylab, Notkestrasse 85, 22607 Hamburg, Germany

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 77, Iss. 12 — 15 March 2008

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×