Transition from thin-film to bulk properties of metamaterials

Carsten Rockstuhl, Thomas Paul, Falk Lederer, Thomas Pertsch, Thomas Zentgraf, Todd P. Meyrath, and Harald Giessen
Phys. Rev. B 77, 035126 – Published 22 January 2008

Abstract

Effective material parameters for metamaterials are usually extracted for a single thin layer only. We show that, in general, these parameters cannot directly be assigned to a multilayered (bulk) metamaterial. The principal issue is the presence of higher-order Bloch modes. These modes are usually negligible for a single layer but can have considerable influence on the results for a periodically stacked structure. In particular, we show examples where a stack of single-layer negative refractive index metamaterials exhibits a positive index. Furthermore, on the basis of the dispersion relation of the respective Bloch modes, we derive criteria for the validity of the effective parameter approach.

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  • Received 27 August 2007

DOI:https://doi.org/10.1103/PhysRevB.77.035126

©2008 American Physical Society

Authors & Affiliations

Carsten Rockstuhl, Thomas Paul, and Falk Lederer

  • Institute of Condensed Matter Theory and Optics, Friedrich Schiller University Jena, Max-Wien-Platz 1, D-07743 Jena, Germany

Thomas Pertsch

  • Institute of Applied Physics, Friedrich Schiller University Jena, Max-Wien-Platz 1, D-07743 Jena, Germany

Thomas Zentgraf*, Todd P. Meyrath, and Harald Giessen

  • 4. Physikalisches Institut, Universität Stuttgart, D-70550 Stuttgart, Germany

  • *Also at Max-Planck-Institut für Festkörperforschung, Heisenbergstr. 1, D-70569 Stuttgart, Germany.
  • Corresponding author: carsten.rockstuhl@uni-jena.de

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Issue

Vol. 77, Iss. 3 — 15 January 2008

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