Dependence of Raman spectra G band intensity on metallicity of single-wall carbon nanotubes

Ki Kang Kim, Jin Sung Park, Sung Jin Kim, Hong Zhang Geng, Kay Hyeok An, Cheol-Min Yang, Kentaro Sato, Riichiro Saito, and Young Hee Lee
Phys. Rev. B 76, 205426 – Published 20 November 2007

Abstract

We report the peculiar behavior of the G band Raman intensity, which is dependent on the metallicity of single-wall carbon nanotubes (SWCNTs). In the metallic SWCNTs, the G band intensity was enhanced relative to the G band intensity, while the G band intensity was suppressed in the semiconducting SWCNTs. Resonance Raman spectroscopy (using laser energies of Elaser=2.41, 1.96, 1.58, and 1.165eV) showed these features on the metal-enriched and semiconducting-enriched SWCNT samples that had been selectively separated by the nitronium ions. The metallicity dependence was explained theoretically by calculating the resonance Raman intensity within the extended tight-binding calculations. The calculated results confirm that the G band intensity of the metallic SWCNTs is stronger than that for the semiconducting SWCNTs because the electron-phonon matrix elements for the TO phonon at the K point is larger for metallic SWCNTs and the resonance window for E33S is larger than that for E11M.

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  • Received 16 January 2007

DOI:https://doi.org/10.1103/PhysRevB.76.205426

©2007 American Physical Society

Authors & Affiliations

Ki Kang Kim1, Jin Sung Park2, Sung Jin Kim1, Hong Zhang Geng1, Kay Hyeok An3, Cheol-Min Yang1, Kentaro Sato2, Riichiro Saito2,*,†, and Young Hee Lee1,*,‡

  • 1Department of Physics, Center for Nanotubes and Nanostructured Composites, Institute of Basic Sciences, Sungkyunkwan University, Suwon 440-746, Republic of Korea
  • 2Department of Physics, Tohoku University and CREST, Sendai 980-8578, Japan
  • 3Material & Development Department, Jeonju Machinery Research Center, Jeonju 561-844, Republic of Korea

  • *Author to whom correspondence should be addressed.
  • rsaito@flex.phys.tohoku.ac.jp
  • leeyoung@skku.edu

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Issue

Vol. 76, Iss. 20 — 15 November 2007

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