Electronic structures of Fe3xMxO4 (M=Mn,Zn) spinel oxide thin films investigated by x-ray photoemission spectroscopy and x-ray magnetic circular dichroism

Junichi Takaobushi, Mizue Ishikawa, Shigenori Ueda, Eiji Ikenaga, Jung-Jin Kim, Masaaki Kobata, Yukiharu Takeda, Yuji Saitoh, Makina Yabashi, Yoshinori Nishino, Daigo Miwa, Kenji Tamasaku, Tetsuya Ishikawa, Issei Satoh, Hidekazu Tanaka, Keisuke Kobayashi, and Tomoji Kawai
Phys. Rev. B 76, 205108 – Published 15 November 2007

Abstract

We fabricated Fe3xMxO4 (M=Mn,Zn) thin film by pulsed laser deposition technique and investigated their electronic structure by hard x-ray photoemission spectroscopy (HX-PES) and x-ray magnetic circular dichroism (XMCD). HX-PES and XMCD revealed that the solid solution system of Fe3xMxO4 (M=Mn,Zn) is the best candidate for tunable ferromagnetic oxide semiconductor judging from systematic change of Fe, Mn core-level spectra, and valence band spectra by substitution. We present a model to explain modulation of electric and magnetic properties and electronic structure evolution caused by strongly correlated electron.

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  • Received 17 April 2007

DOI:https://doi.org/10.1103/PhysRevB.76.205108

©2007 American Physical Society

Authors & Affiliations

Junichi Takaobushi1, Mizue Ishikawa1, Shigenori Ueda2, Eiji Ikenaga3, Jung-Jin Kim3, Masaaki Kobata3, Yukiharu Takeda4, Yuji Saitoh4, Makina Yabashi3, Yoshinori Nishino5, Daigo Miwa5, Kenji Tamasaku5, Tetsuya Ishikawa5, Issei Satoh1, Hidekazu Tanaka1,*, Keisuke Kobayashi2, and Tomoji Kawai1

  • 1The Institute of Scientific and Industrial Research, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan
  • 2National Institute for Materials Science (NIMS), SPring-8, 1-1-1Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148, Japan
  • 3JASRI, SPring-8, 1-1-1Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan
  • 4JAEA, SPring-8, 1-1-1Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148, Japan
  • 5RIKEN, SPring-8, 1-1-1Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148, Japan

  • *h-tanaka@sanken.osaka-u.ac.jp

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Issue

Vol. 76, Iss. 20 — 15 November 2007

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