From tunneling to contact: Inelastic signals in an atomic gold junction from first principles

Thomas Frederiksen, Nicolás Lorente, Magnus Paulsson, and Mads Brandbyge
Phys. Rev. B 75, 235441 – Published 25 June 2007

Abstract

The evolution of electron conductance in the presence of inelastic effects is studied as an atomic gold contact is formed evolving from a low-conductance regime (tunneling) to a high-conductance regime (contact). In order to characterize each regime, we perform density-functional theory (DFT) calculations to study the geometric and electronic structures, together with the strength of the atomic bonds and the associated vibrational frequencies. The conductance is calculated by, first, evaluating the transmission of electrons through the system and, second, by calculating the conductance change due to the excitation of vibrations. As found in previous studies [Paulsson et al., Phys. Rev. B 72, 201101(R) (2005)], the change in conductance due to inelastic effects permits us to characterize the crossover from tunneling to contact. The most notorious effect is the crossover from an increase in conductance in the tunneling regime to a decrease in conductance in the contact regime when the bias voltage matches a vibrational threshold. Our DFT-based calculations actually show that the effect of vibrational modes in electron conductance is rather complex, in particular, when modes localized in the contact region are permitted to extend into the electrodes. As an example, we find that certain modes can give rise to decreases in conductance when in the tunneling regime, opposite to the above-mentioned result. Whereas details in the inelastic spectrum depend on the size of the vibrational region, we show that the overall change in conductance is quantitatively well approximated by the simplest calculation where only the apex atoms are allowed to vibrate. Our study is completed by the application of a simplified model where the relevant parameters are obtained from the above DFT-based calculations.

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  • Received 7 February 2007

DOI:https://doi.org/10.1103/PhysRevB.75.235441

©2007 American Physical Society

Authors & Affiliations

Thomas Frederiksen1,*, Nicolás Lorente2, Magnus Paulsson1, and Mads Brandbyge1

  • 1MIC-Department of Micro and Nanotechnology, NanoDTU, Technical University of Denmark, Ørsteds Plads, Building 345E, DK-2800 Lyngby, Denmark
  • 2Laboratorie Collisions, Agrégats, Réactivité, IRSAMC, Université Paul Sabatier, 118 Route de Narbonne, F-31062 Toulouse, France

  • *Electronic address: thf@mic.dtu.dk

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Vol. 75, Iss. 23 — 15 June 2007

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