Electrical resistivity and scattering processes in (Bi,Pb)2(Sr,La)2CuO6+δ studied by angle-resolved photoemission spectroscopy

Takeshi Kondo, Tsunehiro Takeuchi, Syunsuke Tsuda, and Shik Shin
Phys. Rev. B 74, 224511 – Published 29 December 2006

Abstract

The lifetime of the Bloch states at the Fermi level, the Fermi velocity, and the mean free path of the conduction electrons in (Bi,Pb)2(Sr,La)2CuO6+δ (Bi2201) superconductors are determined by angle-resolved photoemission spectroscopy over a wide range of the hole concentration from heavily overdoped to lightly underdoped conditions. The electrical resistivity in the CuO2 plane is quantitatively reproduced by the calculation with the Boltzmann transport equation using the experimentally determined electronic structure. A detailed investigation on the hole concentration and temperature dependence of the lifetime leads us to conclude that the scattering process of conduction electrons in the vicinity of (π,0) is dominated by electron-electron scattering, whereas around the node direction it is dominated by electron-phonon scattering.

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  • Received 6 February 2006

DOI:https://doi.org/10.1103/PhysRevB.74.224511

©2006 American Physical Society

Authors & Affiliations

Takeshi Kondo1,2, Tsunehiro Takeuchi1,2, Syunsuke Tsuda3, and Shik Shin3

  • 1Department of Crystalline Materials Science, Nagoya University, Nagoya 464-8603, Japan
  • 2EcoTopia Science Institute, Nagoya University, Nagoya 464-8603, Japan
  • 3Institute of Solid State Physics, University of Tokyo, Kashiwa 277-8581, Japan

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Issue

Vol. 74, Iss. 22 — 1 December 2006

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