Abstract
Raman spectra of single (hexagonal wurtzite) nanowires grown by vapor-liquid-solid synthesis were recorded. By investigating the polarization dependence of the Raman intensities of the observed bands as a function of the angle between the long axis of the nanowire and the electric vector of the incident (and scattered) light, one is able to distinguish between nanowires whose crystallographic axis corresponds to ( directed), or is substantially perpendicular to ( directed) the long axis of the nanowire—the two preferred directions of nanowire growth. For -directed nanowires, polarization-dependent Raman intensity analysis can also determine, within tolerable limits, the orientation of the crystalline axis with respect to laboratory-fixed coordinates. Simultaneous transmission electron microscopy (TEM) analyses confirm the conclusions derived from the Raman measurements. The polarization-dependent Raman intensities could only be understood if one assumed a complex-valued Raman tensor. The detection of resonance enhancement together with the tendency of the nanowires to grow with a high concentration of defects and the observation of yellow luminescence in the photoluminescence spectrum may account for the complex-valued Raman tensor we observe for even at sub-band-gap photon energies.
3 More- Received 2 January 2005
DOI:https://doi.org/10.1103/PhysRevB.74.035320
©2006 American Physical Society