Unified model of fractal conductance fluctuations for diffusive and ballistic semiconductor devices

C. A. Marlow, R. P. Taylor, T. P. Martin, B. C. Scannell, H. Linke, M. S. Fairbanks, G. D. R. Hall, I. Shorubalko, L. Samuelson, T. M. Fromhold, C. V. Brown, B. Hackens, S. Faniel, C. Gustin, V. Bayot, X. Wallart, S. Bollaert, and A. Cappy
Phys. Rev. B 73, 195318 – Published 19 May 2006

Abstract

We present an experimental comparison of magnetoconductance fluctuations measured in the ballistic, quasiballistic, and diffusive scattering regimes of semiconductor devices. In contradiction to expectations, we show that the spectral content of the magnetoconductance fluctuations exhibits an identical fractal behavior for these scattering regimes and that this behavior is remarkably insensitive to device boundary properties. We propose a unified model of fractal conductance fluctuations in the ballistic, quasiballistic, and diffusive transport regimes, in which the generic fractal behavior is generated by a subtle interplay between boundary and material-induced chaotic scattering events.

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  • Received 20 September 2005

DOI:https://doi.org/10.1103/PhysRevB.73.195318

©2006 American Physical Society

Authors & Affiliations

C. A. Marlow1, R. P. Taylor1,*, T. P. Martin1, B. C. Scannell1, H. Linke1, M. S. Fairbanks1, G. D. R. Hall1, I. Shorubalko2, L. Samuelson3, T. M. Fromhold4, C. V. Brown5, B. Hackens6, S. Faniel6, C. Gustin6, V. Bayot6, X. Wallart7, S. Bollaert7, and A. Cappy7

  • 1Materials Science Institute, Physics Department, University of Oregon, Eugene, Oregon 97403-1274, USA
  • 2Institute of Solid State Physics, University of Latvia, Kengarga 8, LV-1063, Riga, Latvia
  • 3Solid State Physics and The Nanometer Consortium, Lund University, Box 118, S-221 00 Lund, Sweden
  • 4School of Physics and Astronomy, University of Nottingham, N11 8NS, United Kingdom
  • 5School of Biomedical and Natural Sciences, Nottingham Trent University, NG7 2RD, United Kingdom
  • 6CERMIN, PCPM, and DICE Labs, Université Catholique de Louvain, B-1348, Belgium
  • 7IEMN, Cité Scientifique, Villeneuve d’Ascq, France

  • *Corresponding author. Electronic address: rpt@uoregon.edu

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Issue

Vol. 73, Iss. 19 — 15 May 2006

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