Subwavelength imaging at optical frequencies using a transmission device formed by a periodic layered metal-dielectric structure operating in the canalization regime

Pavel A. Belov and Yang Hao
Phys. Rev. B 73, 113110 – Published 17 March 2006

Abstract

Imaging with subwavelength resolution using a periodic metal-dielectric layered structure is demonstrated. The structure operates in canalization regime as a transmission device and it does not involve negative refraction and amplification of evanescent modes. The thickness of the structure has to be an integer number of half-wavelengths and can be made as large as required for ceratin applications, in contrast to the solid metallic slabs operating with subwavelength resolution which have to be much thinner than the wavelength. Resolution of λ20 at 600nm wavelength is confirmed by numerical simulation for a 300nm thick structure formed by a periodic stack of 10nm layers of glass with ε=2 and 5nm layers of metal-dielectric composite with ε=1. Resolution of λ60 is predicted for a structure with same thickness, period and operating frequency, but formed by 7.76nm layers of silicon with ε=15 and 7.24nm layers of silver with ε=14.

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  • Received 6 October 2005

DOI:https://doi.org/10.1103/PhysRevB.73.113110

©2006 American Physical Society

Authors & Affiliations

Pavel A. Belov and Yang Hao

  • Queen Mary College, University of London, Mile End Road, London E1 4NS, United Kingdom

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Issue

Vol. 73, Iss. 11 — 15 March 2006

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