Correlation effects at ideal SiC{0001}(1×1) surfaces

K. V. Emtsev, Th. Seyller, L. Ley, L. Broekman, A. Tadich, J. D. Riley, R. G. C. Leckey, and M. Preuss
Phys. Rev. B 73, 075412 – Published 9 February 2006

Abstract

We report on studies of the surface band structure of clean and unreconstructed 6HSiC{0001}(1×1) surfaces by angle-resolved photoelectron spectroscopy (ARPES). Using light induced desorption of hydrogen from the H-terminated, unreconstructed 6HSiC{0001} surfaces we were able to prepare these highly metastable surfaces. On both Si face and C face we observe a surface band with (1×1) periodicity derived from the unsaturated surface dangling bonds. In both cases the surface band is located below the Fermi level indicating a semiconducting surface. On the (0001) surface the Si dangling bond band is located 0.8eV above the valence-band maximum (VBM), whereas the C dangling bond band is located 0.2eV above the VBM. The dispersion of the surface bands amount to 0.2 and 0.7 eV, respectively. The experimental observations are discussed in the light of earlier theoretical studies on the surface electronic structure of hexagonal SiC surfaces. It is suggested that the electronic properties of these surfaces are governed by strong correlation effects.

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  • Received 7 October 2005
  • Corrected 9 May 2006

DOI:https://doi.org/10.1103/PhysRevB.73.075412

©2006 American Physical Society

Corrections

9 May 2006

Erratum

Publisher's Note: Correlation effects at ideal SiC{0001}(1×1) surfaces [Phys. Rev. B 73, 075412 (2006)]

K. V. Emtsev, Th. Seyller, L. Ley, L. Broekman, A. Tadich, J. D. Riley, R. G. C. Leckey, and M. Preuss
Phys. Rev. B 73, 199903 (2006)

Authors & Affiliations

K. V. Emtsev, Th. Seyller*, and L. Ley

  • Technische Physik, Universität Erlangen-Nürnberg, Erwin-Rommel-Strasse 1, D-91058 Erlangen, Germany†

L. Broekman, A. Tadich, J. D. Riley, and R. G. C. Leckey

  • Department of Physics, La Trobe University, Bundoora, Victoria 3083, Australia

M. Preuss

  • Institut für Festkörpertheorie und -optik, Friedrich-Schiller-Universität, D-07743 Jena, Germany

  • *Corresponding author. Email address: thomas.seyller@physik.uni-erlangen.de
  • URL: http://www.tp2.uni-erlangen.de

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Issue

Vol. 73, Iss. 7 — 15 February 2006

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