Intensity of the resonance Raman excitation spectra of single-wall carbon nanotubes

J. Jiang, R. Saito, A. Grüneis, S. G. Chou, Ge. G. Samsonidze, A. Jorio, G. Dresselhaus, and M. S. Dresselhaus
Phys. Rev. B 71, 205420 – Published 27 May 2005

Abstract

The electron-phonon matrix elements are calculated for the radial breathing mode (RBM) and the G-band A symmetry mode of single-wall carbon nanotubes. The RBM intensity decreases with increasing nanotube diameter and chiral angle. The RBM intensity at van Hove singular k points is larger outside the two-dimensional Brillouin zone around the K point than inside the Brillouin zone. For the G band A symmetry mode, the matrix element shows that all semiconducting nanotubes have nonzero LO mode intensity, and the LO mode generally has a larger intensity than the TO mode, while the ratio of the intensity of the LO mode to that of the TO mode decreases with increasing chiral angle. In particular, zigzag nanotubes have zero intensity for the TO mode, and armchair nanotubes have zero intensity for the LO mode. Using the matrix elements thus obtained, the resonance Raman excitation profiles are calculated for nanotube samples under different broadening factor γ regimes. For semiconducting nanotubes, the excitation profiles for the RBM are consistent with experiments. For metallic nanotubes, a quantum interference effect in the Raman intensity is found for both the RBM and LO modes. For the RBM and LO modes, different kinds of excitation profiles are discussed for nanotube samples in the large and small γ regimes by considering the electron-phonon matrix element and the trigonal warping effect. For nanotube samples in the large γ regime, a shift in the energy of the peak in the RBM intensity relative to the corresponding peak in the joint density of states is found.

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  • Received 8 December 2004

DOI:https://doi.org/10.1103/PhysRevB.71.205420

©2005 American Physical Society

Authors & Affiliations

J. Jiang1, R. Saito1, A. Grüneis2, S. G. Chou3, Ge. G. Samsonidze4, A. Jorio5,6, G. Dresselhaus7, and M. S. Dresselhaus4,5

  • 1Department of Physics, Tohoku University, Sendai 980-8578, Japan, and CREST, JST, Sendai 980-8578, Japan
  • 2Institute for Solid State Research, Leibniz Institute for Solid State and Materials Research, 01069 Dresden, Germany
  • 3Department of Chemistry, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139-4307, USA
  • 4Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139-4307, USA
  • 5Department of Physics, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139-4307, USA
  • 6Departamento de Física, Universidade Federal de Minas Gerais, Belo Horizonte, Minais Gerais 30123-970, Brazil
  • 7Francis Bitter Magnet Laboratory, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139-4307, USA

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Issue

Vol. 71, Iss. 20 — 15 May 2005

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