Mapping the spin-dependent electron reflectivity of Fe and Co ferromagnetic thin films

J. Graf, C. Jozwiak, A. K. Schmid, Z. Hussain, and A. Lanzara
Phys. Rev. B 71, 144429 – Published 29 April 2005

Abstract

Spin polarized low energy electron microscopy is used as a spin-dependent spectroscopic probe to study the spin-dependent specular reflection of a polarized electron beam from two different magnetic thin film systems: Fe/W(110) and Co/W(110). The reflectivity and spin-dependent exchange-scattering asymmetry are studied as a function of electron kinetic energy and film thickness, as well as the time dependence. The largest value of the figure of merit for spin polarimetry is observed for a five monolayer thick film of Co/W(110) at an electron kinetic energy of 2 eV. This value is 2 orders of magnitude higher than previously obtained with state of the art mini-Mott polarimeter. We discuss implications of our results for the development of an electron-spin-polarimeter using the exchange-interaction at low energy.

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  • Received 29 April 2004

DOI:https://doi.org/10.1103/PhysRevB.71.144429

©2005 American Physical Society

Authors & Affiliations

J. Graf1,*, C. Jozwiak2, A. K. Schmid1, Z. Hussain3, and A. Lanzara1,2

  • 1Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA
  • 2Department of Physics, University of California Berkeley, California 94720, USA
  • 3Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

  • *Electronic address: jeff.graf@a3.epfl.ch

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Vol. 71, Iss. 14 — 1 April 2005

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