Abstract
We measure the spontaneous parametric emission from a semiconductor microcavity after resonant pulsed coherent excitation. Resolving the emission in time and two-dimensional momentum space, the underlying scattering processes, which were theoretically treated by [Ciuti et al. Phys. Rev. B 63, 041303 (2001)], are validated. The predicted figure-8 shaped distribution of the final states of the parametric scattering is observed. We find a narrowing of the momentum distribution with time, which is a feature of memory effects in the scattering due to parametric correlation. Additionally, the influence of higher-order scattering and pump depletion are observed in the experiment.
10 More- Received 23 April 2004
DOI:https://doi.org/10.1103/PhysRevB.70.205301
©2004 American Physical Society