Energetics of MCsn+ molecular ions emitted from Cs+ irradiated surfaces

Subhendu Sarkar, Purushottam Chakraborty, and Hubert Gnaser
Phys. Rev. B 70, 195427 – Published 18 November 2004

Abstract

Kinetic energy distributions of MCsn+ (n=0,1,2,3, …, etc.) molecular ions (M—target element of interest and Cs+—primary ion) emitted in the secondary ion mass spectroscopy process have been studied for various metallic samples (Al, Cu, and Ag) under varying Cs+ impact ion energies (1–5 keV). From the peak shifts of the energy distributions it is argued that the surface binding energy as well as the work function changes with the change in the surface Cs concentration arising out of the variation in the impact ion energy. The dependence of the measured integrated yields of the ions (M+, MCs+, and MCs2+ for individual elements) on the estimated work functions has been found to be exponential. Results have been interpreted in terms of the relative changes in the instantaneous local work function of the sputtered zone. The present study is strongly supportive of the suggested formation mechanism of a MCs2+ molecular ion via a combination of M and two Cs+ ions in the close proximity of the Cs-covered surface.

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  • Received 11 May 2004

DOI:https://doi.org/10.1103/PhysRevB.70.195427

©2004 American Physical Society

Authors & Affiliations

Subhendu Sarkar and Purushottam Chakraborty

  • Surface Physics Division, Saha Institute of Nuclear Physics, 1/AF Bidhannagar, Kolkata 700064, India

Hubert Gnaser

  • Fachbereich Physik and Institut für Oberflächen- und Schichtanalytik, Technische Universität Kaiserslautern, D-67663 Kaiserslautern, Germany

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Issue

Vol. 70, Iss. 19 — 15 November 2004

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