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Radiation-induced oscillatory Hall effect in high-mobility GaAs/AlxGa1xAs devices

R. G. Mani, V. Narayanamurti, K. von Klitzing, J. H. Smet, W. B. Johnson, and V. Umansky
Phys. Rev. B 69, 161306(R) – Published 22 April 2004
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Abstract

We examine the radiation induced modification of the Hall effect in high-mobility GaAs/AlxGa1xAs devices that exhibit vanishing resistance under microwave excitation. The modification in the Hall effect upon irradiation is characterized by (a) a small reduction in the slope of the Hall resistance curve with respect to the dark value, (b) a periodic reduction in the magnitude of the Hall resistance Rxy that correlates with an increase in the diagonal resistance Rxx, and (c) a Hall resistance correction that disappears as the diagonal resistance vanishes.

  • Received 20 October 2003

DOI:https://doi.org/10.1103/PhysRevB.69.161306

©2004 American Physical Society

Authors & Affiliations

R. G. Mani1,*, V. Narayanamurti1, K. von Klitzing2, J. H. Smet2, W. B. Johnson3, and V. Umansky4

  • 1Harvard University, Gordon McKay Laboratory of Applied Science, 9 Oxford Street, Cambridge, Massachusetts 02138, USA
  • 2Max-Planck-Institut für Festkörperforschung, Heisenbergstrasse 1, 70569 Stuttgart, Germany
  • 3Laboratory for Physical Sciences, University of Maryland, College Park, Maryland 20740, USA
  • 4Braun Center for Submicron Research, Weizmann Institute, Rehovot 76100, Israel

  • *Email address: mani@deas.harvard.edu

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Vol. 69, Iss. 16 — 15 April 2004

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