High-resolution optical detection of electron spin resonance in epitaxial semiconductor layers by coherent Raman spectroscopy

S. J. Bingham, J. J. Davies, and D. Wolverson
Phys. Rev. B 65, 155301 – Published 18 March 2002
PDFExport Citation

Abstract

We describe the application to semiconductors of a microwave-frequency optical heterodyne technique that enables electron-spin-resonance spectra to be detected through coherent Raman scattering. The technique is sufficiently sensitive to detect spectra from epitaxial layers and has the added advantage of optical selectivity. We demonstrate its effectiveness with studies of a ZnSe epitaxial layer in which there is a variation in strain. The spin-resonance linewidths are sufficiently narrow for the gyromagnetic ratio to be determined with a precision of 1 part in 104 and, as the laser is tuned to resonance with differently strained parts of the material, the g value changes at a rate of approximately 0.4eV1. We have carried out the experiment in both transmission and reflection geometries and the technique promises to be of wide applicability.

  • Received 29 November 2001

DOI:https://doi.org/10.1103/PhysRevB.65.155301

©2002 American Physical Society

Authors & Affiliations

S. J. Bingham, J. J. Davies, and D. Wolverson

  • Department of Physics, University of Bath, Bath, BA2 7AY, United Kingdom

References (Subscription Required)

Click to Expand
Issue

Vol. 65, Iss. 15 — 15 April 2002

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×