Surface roughening at the one-monolayer Sb/Si(100) interface

A. A. Saranin, A. V. Zotov, V. G. Kotlyar, V. G. Lifshits, O. Kubo, T. Harada, T. Kobayashi, N. Yamaoka, M. Katayama, and K. Oura
Phys. Rev. B 65, 033312 – Published 28 December 2001
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Abstract

Using scanning tunneling microscopy observations, it has been found that the atomically flat 1-ML Sb/Si(100) interface is metastable at a temperature of about 750°C and becomes rough upon brief annealing, although the Sb-dimer-row structure of the top layer is completely preserved. The roughening is explained by displacive adsorption of Sb (i.e., by substitution of the top-layer Si atoms by Sb atoms) and this phenomenon is suggested to be a common one for group-V adsorbates on Si(100) and Ge(100) surfaces.

  • Received 18 June 2001

DOI:https://doi.org/10.1103/PhysRevB.65.033312

©2001 American Physical Society

Authors & Affiliations

A. A. Saranin

  • Department of Electronic Engineering, Faculty of Engineering, Osaka University, Suita, Osaka 565, Japan
  • Institute of Automation and Control Processes, 690041 Vladivostok, Russia
  • Faculty of Physics and Engineering, Far Eastern State University, 690000 Vladivostok, Russia

A. V. Zotov

  • Department of Electronic Engineering, Faculty of Engineering, Osaka University, Suita, Osaka 565, Japan
  • Department of Electronics, Vladivostok State University of Economics and Service, 690600 Vladivostok, Russia
  • Institute of Automation and Control Processes, 690041 Vladivostok, Russia

V. G. Kotlyar and V. G. Lifshits

  • Institute of Automation and Control Processes, 690041 Vladivostok, Russia

O. Kubo, T. Harada, T. Kobayashi, N. Yamaoka, M. Katayama, and K. Oura*

  • Department of Electronic Engineering, Faculty of Engineering, Osaka University, Suita, Osaka 565, Japan

  • *Corresponding author.

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Issue

Vol. 65, Iss. 3 — 15 January 2002

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