Step-induced in-plane orbital anisotropy in FeNi films on Cu(111) probed by magnetic circular x-ray dichroism

S. Cherifi, C. Boeglin, S. Stanescu, J. P. Deville, C. Mocuta, H. Magnan, P. Le Fèvre, P. Ohresser, and N. B. Brookes
Phys. Rev. B 64, 184405 – Published 15 October 2001
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Abstract

The effects of nanostructured magnetic Fe65Ni35 films deposited on a vicinal Cu(111) single-crystal surface on the magnetic anisotropy have been studied using magnetic circular x-ray dichroism (MCXD) at the Fe L2,3 edges. In the one-dimensional (1D) limit a large dipolar out-of-plane anisotropy is evidenced with in-plane isotropic magnetic moments. After the 1D coalescence the orbital moment shows a more complex behavior depending on the in-plane direction of saturation. We show that MCXD is strongly sensitive to in-plane orbital anisotropy for the 1D stripes. We demonstrate the importance of the step induced in-plane anisotropy by measuring the orbital magnetic moment dependence as a function of the in-plane azimuth angle. In the submonolayer regime an in-plane magnetic anisotropy is observed related to the step decoration growth mode. In the thickness range of 2–4 equivalent monolayers, 2D coalescence induces a strong in-plane magnetic anisotropy of the magnetic orbital moment. The microscopic origin of the strong in-plane variation of ML has been attributed to magnetocrystalline effects. Strained films give rise to an in-plane magnetic anisotropy energy up to 2 meV/at., which is larger than those measured out of the plane (0–1 meV/at.).

  • Received 26 December 2000

DOI:https://doi.org/10.1103/PhysRevB.64.184405

©2001 American Physical Society

Authors & Affiliations

S. Cherifi, C. Boeglin*, S. Stanescu, and J. P. Deville

  • Institut de Physique et Chimie des Matériaux de Strasbourg, UMR 7504, 23 rue du Loess, Boite Postale 20 CR, F-67037 Strasbourg, France

C. Mocuta

  • Department de Recherche Fondamentale sur la Matière Condensée, SP2M/IRS, Commissariat à l’Energie Atomique, Grenoble, France

H. Magnan

  • Commissariat á l’Energie Atomique, DRECAM-SPCSI, 91191 Gif sur Yvette, France
  • Laboratoire pour l’Utilisation du Rayonnement Electromagnetique, UMR 130, Université de Paris-Sud, 91405 Orsay, France

P. Le Fèvre

  • Laboratoire pour l’Utilisation du Rayonnement Electromagnetique, UMR 130, Université de Paris-Sud, 91405 Orsay, France

P. Ohresser and N. B. Brookes

  • European Synchrotron Radiation Facility (ESRF), Grenoble, France

  • *Author to whom correspondence should be addressed. Present address: Groupe Surfaces-Interfaces, IPCMS, 23 rue du Loess, F-67037 Strasbourg, France. Electronic address: Christine.Boeglin@ipcms.u-strasbg.fr
  • Present address: LURE, UMR 130, Université Paris-Sud, 91405 Orsay, France.

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Vol. 64, Iss. 18 — 1 November 2001

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