Formation of a Si(100)c(8×2) surface phase using H-induced self-organization and H extraction

O. Kubo, T. Kobayashi, N. Yamaoka, A. A. Saranin, A. V. Zotov, H. Ohnishi, M. Katayama, and K. Oura
Phys. Rev. B 64, 153406 – Published 18 September 2001
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Abstract

A Si(100)c(8×2) surface phase has been fabricated using atomic-hydrogen-induced self-organization followed by hydrogen extraction by the tip of scanning tunneling microscope. Similar to a conventional Si(100)2×1 surface, the new phase is built of Si dimer rows, but with every second dimer row being missing. The second-layer Si atoms in the troughs between dimer rows are also dimerized. The second-layer Si dimers at the opposite sides of a top Si dimer row demonstrate a tendency to be out of phase. This configuration induces buckling of the top Si dimer with a c(8×2) periodicity.

  • Received 15 June 2001

DOI:https://doi.org/10.1103/PhysRevB.64.153406

©2001 American Physical Society

Authors & Affiliations

O. Kubo*, T. Kobayashi, and N. Yamaoka

  • Department of Electronic Engineering, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan

A. A. Saranin and A. V. Zotov

  • Department of Electronic Engineering, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan
  • Institute of Automation and Control Processes, 5 Radio Street, 690041 Vladivostok, Russia

H. Ohnishi

  • Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, Ibaraki, Osaka 567-0047, Japan

M. Katayama and K. Oura

  • Department of Electronic Engineering, Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan

  • *Author to whom correspondence should be addressed. Electronic address: okubo@ele.eng.osaka-u.ac.jp

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Vol. 64, Iss. 15 — 15 October 2001

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