Measurement of conservative and dissipative tip-sample interaction forces with a dynamic force microscope using the frequency modulation technique

H. Hölscher, B. Gotsmann, W. Allers, U. D. Schwarz, H. Fuchs, and R. Wiesendanger
Phys. Rev. B 64, 075402 – Published 13 July 2001
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Abstract

The measurement principle of dynamic-force microscopy using the frequency-modulation (FM) detection scheme is investigated by analytical as well as numerical approaches. As the detection method is based on the properties of a self-driven oscillator, we discuss the main differences from an externally driven oscillator. We then derive an analytical expression, which clarifies how the measured quantities of the FM technique, the frequency shift, and the gain factor (or “excitation amplitude”) are influenced by the time (“phase”) shift. Introducing a very general tip-sample force law, we show that the frequency shift is determined by the mean tip-sample force whereas the gain factor is directly related to dissipative processes like hysteresis or viscous damping.

  • Received 15 February 2001

DOI:https://doi.org/10.1103/PhysRevB.64.075402

©2001 American Physical Society

Authors & Affiliations

H. Hölscher1,*, B. Gotsmann2,†, W. Allers1,*, U. D. Schwarz1,‡, H. Fuchs2, and R. Wiesendanger1

  • 1Institute of Applied Physics, University of Hamburg, Jungiusstr. 11, 20355 Hamburg, Germany
  • 2Institute of Physics, University of Münster, Wilhelm-Klemm-Str. 10, 48149 Münster, Germany

  • *Present address: Infineon Technologies, St. Martin Strasse 76, 81541, Munich, Germany.
  • Present address: IBM Research Division, Zurich Research Laboratory, CH-8803, Ruschilkon, Switzerland.
  • Present address: Lawrence Berkeley National Laboratory, Materials Science Division (Bldg. 66), University of California, 1 Cyclotron Road, Berkeley, CA 94720.

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Vol. 64, Iss. 7 — 15 August 2001

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