Structure stability and carrier localization in CdX(X=S,Se,Te) semiconductors

Su-Huai Wei and S. B. Zhang
Phys. Rev. B 62, 6944 – Published 15 September 2000
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Abstract

We studied systematically the structural and electronic properties of binary CdX (X=S, Se, and Te) semiconductors in both zinc-blende (ZB) and wurtzite (WZ) structures, the band alignment on the ZB/WZ interfaces, and carrier localization induced by the band offsets. We show, by first-principles band-structure calculation that at low temperature, CdS is stable in the wurtzite structure, while CdSe and CdTe are stable in the zinc-blende structure. However, coherent substrate strain can change CdTe to be more stable in the wurtzite form. We find that CdX in the wurtzite structure has a larger band gap than the one in the zinc-blende structure. The band alignment on the ZB/WZ interface is found to be type II with holes localized on the wurtzite side and electrons on the zinc-blende side.

  • Received 6 March 2000

DOI:https://doi.org/10.1103/PhysRevB.62.6944

©2000 American Physical Society

Authors & Affiliations

Su-Huai Wei and S. B. Zhang

  • National Renewable Energy Laboratory, Golden, Colorado 80401

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Vol. 62, Iss. 11 — 15 September 2000

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