Abstract
Frequency modulation atomic force microscopy is a method for imaging the surface of metals, semiconductors and insulators in ultrahigh vacuum with true atomic resolution. The imaging signal in this technique is the frequency shift of an oscillating cantilever with eigenfrequency spring constant k and amplitude A, which is subject to tip-sample forces Here, we present analytical results of for several basic classes of With these results, a method to calculate images is derived and demonstrated with an example.
- Received 24 March 1999
DOI:https://doi.org/10.1103/PhysRevB.61.9968
©2000 American Physical Society