Dephasing in InAs/GaAs quantum dots

P. Borri, W. Langbein, J. Mørk, J. M. Hvam, F. Heinrichsdorff, M.-H. Mao, and D. Bimberg
Phys. Rev. B 60, 7784 – Published 15 September 1999
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Abstract

The room-temperature dephasing in InAs/GaAs self-assembled quantum dots is measured using two independent methods: spectal-hole burning and four-wave mixing. Dephasing times weakly dependent on the excitation density are found, with a low density value of 290±80fs from spectal-hole burning and of 260±20fs from four-wave mixing.

  • Received 8 June 1999

DOI:https://doi.org/10.1103/PhysRevB.60.7784

©1999 American Physical Society

Authors & Affiliations

P. Borri, W. Langbein, J. Mørk, and J. M. Hvam

  • Research Center COM, The Technical University of Denmark, Building 349, DK–2800 Lyngby, Denmark

F. Heinrichsdorff, M.-H. Mao, and D. Bimberg

  • Institut für Festkörperphysik, Technische Universität Berlin, Hardenbergstrasse 36, 10623 Berlin, Germany

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Vol. 60, Iss. 11 — 15 September 1999

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