Binding energy and dephasing of biexcitons in In0.18Ga0.82As/GaAs single quantum wells

P. Borri, W. Langbein, J. M. Hvam, and F. Martelli
Phys. Rev. B 60, 4505 – Published 15 August 1999
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Abstract

Biexciton binding energies and biexciton dephasing in In0.18Ga0.82As/GaAs single quantum wells have been measured by time-integrated and spectrally resolved four-wave mixing. The biexciton binding energy increases from 1.5 to 2.6 meV for well widths increasing from 1 to 4 nm. The ratio between exciton and biexciton binding energy changes from 0.23 to 0.3 with increasing inhomogeneous broadening, corresponding to increasing well width. From the temperature dependence of the exciton and biexciton four-wave mixing signal decay, we have deduced the acoustic-phonon scattering of the exciton-biexciton transition. It is found to be comparable to that of the exciton transition, indicating that the deformation potential interactions for the exciton and the exciton-biexciton transitions are comparable.

  • Received 24 November 1998

DOI:https://doi.org/10.1103/PhysRevB.60.4505

©1999 American Physical Society

Authors & Affiliations

P. Borri, W. Langbein, and J. M. Hvam

  • Research Center COM, The Technical University of Denmark, Building 349, DK-2800 Lyngby, Denmark

F. Martelli

  • Fondazione Ugo Bordoni, via B. Castiglione 59, I-00142 Roma, Italy

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Issue

Vol. 60, Iss. 7 — 15 August 1999

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