Scattering-matrix treatment of patterned multilayer photonic structures

D. M. Whittaker and I. S. Culshaw
Phys. Rev. B 60, 2610 – Published 15 July 1999
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Abstract

We present calculations of surface reflectivity and emission spectra for multilayer dielectric waveguides with a two-dimensional patterning of deep holes. The spectra are obtained using a scattering-matrix treatment to propagate electromagnetic waves through the structure. This treatment incorporates, in a natural way, the extended boundary conditions necessary to describe external reflection and emission processes. The calculated spectra demonstrate how such measurements can be used to obtain experimental information about the waveguide photonic band structure, the coupling of scattering modes to external fields, and the field distribution within the waveguide.

  • Received 18 February 1999

DOI:https://doi.org/10.1103/PhysRevB.60.2610

©1999 American Physical Society

Authors & Affiliations

D. M. Whittaker

  • Toshiba Research Europe Limited, 260 Cambridge Science Park, Cambridge CB4 0WE, United Kingdom

I. S. Culshaw

  • Department of Physics and Astronomy, University of Sheffield, Sheffield S3 7RH, United Kingdom

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Vol. 60, Iss. 4 — 15 July 1999

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